Article (Scientific journals)
On the structure of liquid IV-VI semiconductors
Raty, Jean-Yves; Gaspard, Jean-Pierre; Bionducci, M. et al.
1999In Journal of Non-Crystalline Solids, 250-252, p. 277-280280
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Keywords :
Experimental/ electrical resistivity; germanium compounds; IV-VI semiconductors; liquid semiconductors; liquid structure; neutron diffraction; tin compounds; van der Waals forces/ structure; liquid IV-VI semiconductors; crystalline structure; stoichiometric IV-VI semiconductors; NaCl structure; distortion amplitude; corrugated planes; covalently bonded atoms; dispersion Van der Waals forces; neutron scattering; liquid phases; GeS; GeSe; GeTe; SnS; SnSe; SnTe; local order; conductivity/ A6125K Structure of molten salts A7220F Low-field transport and mobility; piezoresistance (semiconductors/insulators) A7280P Electrical conductivity of liquid semiconductors/ GeS/bin Ge /bin S/bin; GeSe/bin Ge /bin Se/bin; GeTe/bin Ge /bin Te/bin; SnS/bin Sn /bin S/bin; SnSe/bin Se /bin Sn/bin; SnTe/bin Sn /bin Te/bin
Abstract :
[en] The crystalline structure of most stoichiometric IV-VI semiconductors can be viewed as a distortion of the NaCl structure; the distortion amplitude depends on the components. As a result, corrugated planes of covalently bonded atoms are linked by dispersion (Van der Waals) forces. Neutron scattering experiments were performed on the liquid phases of a series of IV-VI compounds (GeS, GeSe, GeTe, SnS, SnSe and SnTe). We show that the evolution of the local order is correlated with the conductivity measurements
Disciplines :
Physics
Chemistry
Author, co-author :
Raty, Jean-Yves  ;  Université de Liège - ULiège > Département de physique > Physique de la matière condensée
Gaspard, Jean-Pierre  ;  Université de Liège - ULiège > Département de physique > Département de physique
Bionducci, M.
Ceolin, R.
Bellissent, R.
Language :
English
Title :
On the structure of liquid IV-VI semiconductors
Publication date :
1999
Journal title :
Journal of Non-Crystalline Solids
ISSN :
0022-3093
Publisher :
Elsevier Science, Amsterdam, Netherlands
Volume :
250-252
Pages :
277-280280
Peer reviewed :
Peer Reviewed verified by ORBi
Available on ORBi :
since 25 January 2012

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