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Poster (Scientific congresses and symposiums)
Model-Based Multifactor Dimensionality Reduction to detect epistasis for quantitative traits in the presence of error-free and noisy data
Mahachie John, Jestinah; Van Lishout, François; Van Steen, Kristel
201019TH ANNUAL IGES CONFERENCE
 

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Disciplines :
Genetics & genetic processes
Author, co-author :
Mahachie John, Jestinah ;  Université de Liège - ULiège > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Bioinformatique
Van Lishout, François
Van Steen, Kristel
Language :
English
Title :
Model-Based Multifactor Dimensionality Reduction to detect epistasis for quantitative traits in the presence of error-free and noisy data
Publication date :
October 2010
Event name :
19TH ANNUAL IGES CONFERENCE
Event place :
Boston, United States
Audience :
International
Available on ORBi :
since 20 January 2012

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