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Poster (Scientific congresses and symposiums)
The effects of attentional level and test format on the resistance to false memories.
Dehon, Hedwige; Lampinen, James Michael
2006Fourth International Conference on Memory (ICOM 4),
 

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Keywords :
false memories; divided attention; modality
Disciplines :
Theoretical & cognitive psychology
Author, co-author :
Dehon, Hedwige ;  Université de Liège - ULiège > Département de Psychologie : cognition et comportement > Psychologie cognitive
Lampinen, James Michael
Language :
English
Title :
The effects of attentional level and test format on the resistance to false memories.
Publication date :
2006
Event name :
Fourth International Conference on Memory (ICOM 4),
Event organizer :
University of New SouthWales, sydney
Event place :
Sydney, Australia
Audience :
International
Available on ORBi :
since 11 January 2012

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