Reference : Electronic speckle pattern interferometry at thermal infrared wavelengths: a new tech...
Scientific congresses and symposiums : Unpublished conference
Physical, chemical, mathematical & earth Sciences : Space science, astronomy & astrophysics
http://hdl.handle.net/2268/105396
Electronic speckle pattern interferometry at thermal infrared wavelengths: a new technique for combining temperature and displacement measurements
English
Georges, Marc mailto [Université de Liège - ULg > > CSL (Centre Spatial de Liège) >]
Thizy, Cédric mailto [Université de Liège - ULg > > CSL (Centre Spatial de Liège) >]
Vandenrijt, Jean-François mailto [Université de Liège - ULg > > CSL (Centre Spatial de Liège) >]
Alexeenko, Igor [> >]
Pedrini, Giancarlo [> >]
Osten, W. [> >]
Aldave, I. [> >]
Lopez, I. [> >]
Saez de Ocariz, I. [> >]
Vollheim, Birgit [> >]
Dammass, G. [> >]
Krausz, M. [> >]
8-Feb-2011
No
No
International
Photomechanics 2011 – An international conference on full-field measurement techniques
du 7 au 9 février 2011
Vrije Universiteit Brussel
Bruxelles
Belgique
[en] ESPI ; infrared ; LWIR ; speckle ; inerferometry ; thermography
http://hdl.handle.net/2268/105396

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