| Electronic speckle pattern interferometry at thermal infrared wavelengths: a new technique for combining temperature and displacement measurements |
| English |
| Georges, Marc [Université de Liège - ULg > > CSL (Centre Spatial de Liège) >] |
| Thizy, Cédric [Université de Liège - ULg > > CSL (Centre Spatial de Liège) >] |
| Vandenrijt, Jean-François [Université de Liège - ULg > > CSL (Centre Spatial de Liège) >] |
| Alexeenko, Igor [> >] |
| Pedrini, Giancarlo [> >] |
| Osten, W. [> >] |
| Aldave, I. [> >] |
| Lopez, I. [> >] |
| Saez de Ocariz, I. [> >] |
| Vollheim, Birgit [> >] |
| Dammass, G. [> >] |
| Krausz, M. [> >] |
| 8-Feb-2011 |
| No |
| No |
| International |
| Photomechanics 2011 – An international conference on full-field measurement techniques |
| du 7 au 9 février 2011 |
| Vrije Universiteit Brussel |
| Bruxelles |
| Belgique |
| [en] ESPI ; infrared ; LWIR ; speckle ; inerferometry ; thermography |
| http://hdl.handle.net/2268/105396 |