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See detailMeasurements of non-Rutherford cross sections for 4-15 MeV alpha particles on light elements from C to Si
Chene, Grégoire ULg; Mathis, François ULg; Fleury-Frenette, Karl ULg et al

Conference (2013, September)

These last years Ion Beam Analysis users show an interest in High Energy Alpha beams[1]. These beams can be used for on-site analysis by means of radioactive sources e.g. for space application but they ... [more ▼]

These last years Ion Beam Analysis users show an interest in High Energy Alpha beams[1]. These beams can be used for on-site analysis by means of radioactive sources e.g. for space application but they also offer a powerful combination of properties for the analysis of thick layers (about 10 to 20 µm). This kind of layers is often met in cultural heritage applications but can be also present on new materials. Contrary to this kind of materials where the principal information needed is the in-depth profiles as the sample are of known composition, for cultural heritage materials the combination of elemental analysis and their in-depth distribution is essential as the nature of the material is a-priori not known. In this perspective high energy alpha beams can produce really interesting results as their PIXE cross-sections increase from 6 MeV while the lower penetration of the beam (comparing to classical protons beams) allows to limit the analysis to the layer of interest. For the elemental in depth distribution we take advantage of the good mass separation of the alpha particles and the non-Rutherford phenomena allow the analysis even of light elements which are of great interest in cultural heritage problematic as far as the cross section are well tabulated. Using two IBA facilities (AGLAE in Paris and the HE-HR beam line of the cyclotron in Liège University[2]) we explored the backscattering cross section of numerous light elements (from C to Si) from 4 to 15 MeV in order to check the lack in the literature, to verify the deviation from Rutherford law and compare it to the existing theoretical models. We begin to measure the needed cross sections using thick target in case of smooth cross section and thin layers for exploring important variation of the cross section. [less ▲]

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See detailIon-beam analysis for cultural heritage on the AGLAE facility: impact of PIXE/RBS combination
Salomon, Joseph; Dran, Jean-Claude; Guillou, T. et al

in Applied Physics A : Materials Science & Processing (2008), 92(1), 43-50

The combination of particle-induced X-ray emission (PIXE) and Rutherford backscattering (RBS) is particularly fruitful for the study of cultural heritage objects. Several set-ups have been developed at ... [more ▼]

The combination of particle-induced X-ray emission (PIXE) and Rutherford backscattering (RBS) is particularly fruitful for the study of cultural heritage objects. Several set-ups have been developed at the AGLAE facility of the Louvre Laboratory to implement these techniques with an external beam. Successively have been tested the simultaneous use of PIXE and RBS with a single beam of protons, the sequential application of PIXE with protons and RBS with 4He2+ ions and finally the simultaneous implementation of PIXE and RBS with high-energy 4He2+ ions. Several examples illustrate the benefits of these combinations of techniques. [less ▲]

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See detailPresent and future role of ion beam analysis in the study of cultural heritage materials: The example of th AGLAE facility
Salomon, Joseph; Dran, Jean-Claude; Guillou, T. et al

in Nuclear Instruments & Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms (2008), 266

The application of IBA to cultural heritage mostly relies on the use of PIXE because of its high sensitivity and its ease of implementation at atmospheric pressure. The need for depth information not ... [more ▼]

The application of IBA to cultural heritage mostly relies on the use of PIXE because of its high sensitivity and its ease of implementation at atmospheric pressure. The need for depth information not easily available with this technique has conducted to associate RBS also in external beam mode. We have progressively developed a set-up that permits such a combination of techniques either simultaneously or sequentially. The set-up is currently further improved to permit NRA measurement (depth profiles of light elements) in addition to PIXE and RBS. The coupling of all these techniques provides a wealth of information on cultural heritage objects, not easily attainable with any other single method. [less ▲]

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See detailExploring Advantages of 4He-PIXE for layered Objects in Cultural Heritage
Röhrs, Stefan; Calligaro, Thomas; Mathis, François ULg et al

in Nuclear Instruments & Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms (2006), 249

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See detailIn situ dynamic analysis of solid or aqueous solutions undergoing chemical reactions by RBS or PIXE with external beam
Bouquillon, A.; Dran, J*-C; Lagarde, G. et al

in Nuclear Instruments & Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms (2002), 188

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