TiO2 mesoporous thin films studied by Atmospheric Ellipsometric Porosimetry: A case of contaminationDubreuil, Olivier ; Dewalque, Jennifer ; Chene, Grégoire et alin Microporous & Mesoporous Materials (2011), 147 Anatase mesoporous TiO2 thin films are frequently prepared by surfactant templating to control porosity development and Atmospheric Ellipsometric Porosimetry is a reliable and fast technique allowing the ... [more ▼] Anatase mesoporous TiO2 thin films are frequently prepared by surfactant templating to control porosity development and Atmospheric Ellipsometric Porosimetry is a reliable and fast technique allowing the determination of the porosity of such films. After prolonged exposition to high-vacuum (6×10-6 mbar), the films porosity exhibits a degraded behavior during porosimetric measurements, indicating a vacuum-induced modification. The main effect resulting from such exposition to high-vacuum is a wet- tability modification of the films, resulting in an increase of the hydrophobic character of the TiO2 surface. This evolution induces non-correct results in porosimetric measurements due to the fact that the contact angle parameter needed to calculate the pore size distribution is highly different from the reference films. A surface contamination explains such modifications and a restoration of the films is obtained by using ultraviolet treatment. [less ▲] Detailed reference viewed: 86 (34 ULg) Analysis of thin layers for photovoltaic application: Comparison between RBS and ellipsometry on the determination of roughness and porosityMathis, François ; Dewalque, Jennifer ; Dubreuil, Olivier et alPoster (2010) Detailed reference viewed: 78 (48 ULg) |
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