References of "Moignard, B"
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See detailIon-beam analysis for cultural heritage on the AGLAE facility: impact of PIXE/RBS combination
Salomon, Joseph; Dran, Jean-Claude; Guillou, T. et al

in Applied Physics A : Materials Science & Processing (2008), 92(1), 43-50

The combination of particle-induced X-ray emission (PIXE) and Rutherford backscattering (RBS) is particularly fruitful for the study of cultural heritage objects. Several set-ups have been developed at ... [more ▼]

The combination of particle-induced X-ray emission (PIXE) and Rutherford backscattering (RBS) is particularly fruitful for the study of cultural heritage objects. Several set-ups have been developed at the AGLAE facility of the Louvre Laboratory to implement these techniques with an external beam. Successively have been tested the simultaneous use of PIXE and RBS with a single beam of protons, the sequential application of PIXE with protons and RBS with 4He2+ ions and finally the simultaneous implementation of PIXE and RBS with high-energy 4He2+ ions. Several examples illustrate the benefits of these combinations of techniques. [less ▲]

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See detailPresent and future role of ion beam analysis in the study of cultural heritage materials: The example of th AGLAE facility
Salomon, Joseph; Dran, Jean-Claude; Guillou, T. et al

in Nuclear Instruments & Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms (2008), 266

The application of IBA to cultural heritage mostly relies on the use of PIXE because of its high sensitivity and its ease of implementation at atmospheric pressure. The need for depth information not ... [more ▼]

The application of IBA to cultural heritage mostly relies on the use of PIXE because of its high sensitivity and its ease of implementation at atmospheric pressure. The need for depth information not easily available with this technique has conducted to associate RBS also in external beam mode. We have progressively developed a set-up that permits such a combination of techniques either simultaneously or sequentially. The set-up is currently further improved to permit NRA measurement (depth profiles of light elements) in addition to PIXE and RBS. The coupling of all these techniques provides a wealth of information on cultural heritage objects, not easily attainable with any other single method. [less ▲]

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See detailIn situ dynamic analysis of solid or aqueous solutions undergoing chemical reactions by RBS or PIXE with external beam
Bouquillon, A.; Dran, J*-C; Lagarde, G. et al

in Nuclear Instruments & Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms (2002), 188

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