References of "Gencarelli, Federica"
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See detailBandgap Measurement by Spectroscopic Ellipsometry for Strained Ge1-xSnx
Shimura, Yosuke; Wang, Wei; Nieddu, Thomas ULg et al

Conference (2013, June 04)

Detailed reference viewed: 20 (0 ULg)
See detailElectrical Activity of Threading Dislocations and Defect Complexes in GeSn Epitaxial Layers
Gupta, Somya; Simoen, Eddy; Asano, Takanori et al

Conference (2013, June 04)

Detailed reference viewed: 18 (0 ULg)
See detailComposition and Thickness Dependence of GeSn Growth by Chemical Vapor Deposition
Wang, Wei; Shimura, Yosuke; Nieddu, Thomas ULg et al

Conference (2013, June 04)

Detailed reference viewed: 16 (0 ULg)
See detailEpitaxial Si, SiGe and Ge for high-performance devices
Loo, Roger; Hikavyy, Andriy; Vincent, Benjamin et al

Conference (2010, September 23)

Detailed reference viewed: 62 (4 ULg)