Isolating the 130.4 nm and 135.6 nm emissions in Ganymede’s aurora using broadband optics

Conference (2012, September 27)

We discuss a technique for isolating the two main Far Ultraviolet emission lines in Ganymede’s aurora by adding flight proven transmission filters to a broad- band, wide-field imager design. We find that ... [more ▼]

We discuss a technique for isolating the two main Far Ultraviolet emission lines in Ganymede’s aurora by adding flight proven transmission filters to a broad- band, wide-field imager design. We find that the ra- tio of OI emissions at 135.6 nm and 130.4 nm can be recovered if the transmission of the filters and other optical elements are well known. This ratio allows constraints to be placed on the relative abundances of O atoms and O2 molecules within Ganymede’s at- mosphere, leading to more accurate models of atmo- spheric composition. [less ▲]

Method for manufacturing an improved optical layer of light emitting device with surface nano-micro texturation based on coherent electromagnetic radiation speckle lithography

Patent (2012)

An object of the present invention is to provide a cheap, rapid, controlled, reproducible and polyvalent method for manufacturing a light emitting device with an internal source of light capable of ... [more ▼]

An object of the present invention is to provide a cheap, rapid, controlled, reproducible and polyvalent method for manufacturing a light emitting device with an internal source of light capable of achieving an enhancement in extraction efficiency. The invention proposes a method for manufacturing an optical layer for a light emitting device having an internal source of light and an optical layer separating the internal source of light and an external medium of light diffusion, wherein the method comprises the use of coherent electromagnetic radiation speckle lithography, such as laser speckle lithography, to make a nano/micro texturation on at least one surface of the optical layer [less ▲]

Ripple topography and roughness evolution on surface of polycrystalline gold and silver thin films under low energy Ar-ion beam sputtering

in Applied Surface Science (2012), 258

Metallic thin films of gold and silver have been sputtered by argon ions at low energy in the framework of technological applications including nanostructuring and ion beam figuring. Ion beam sputtering ... [more ▼]

Metallic thin films of gold and silver have been sputtered by argon ions at low energy in the framework of technological applications including nanostructuring and ion beam figuring. Ion beam sputtering at high angle of incidence usually leads to spontaneous formation of periodic structures on the target surface, commonly referred as ripples. In this work, ripples dimensions and roughness evolution have been studied as function of the angle of incidence (0–80°), ion beam energy (400 – 1200 eV) and ion flux. The ripple wave vector direction was always observed perpendicular to the ion beam direction for both materials, in agreement with theoretical predictions for the investigated experimental conditions. The decrease of ripple wavelength with energy and ion flux shows the dominance of thermal diffusion as smoothing mechanism. Moreover, three regimes for roughness evolution on gold and silver films have been observed as function of the angle of incidence for sputtering at 650 eV, with a minimum roughness achieved around 45° and 60° for gold and silver, respectively. [less ▲]

Integrated prism-free coupled surface plasmon resonance biochemical sensor

in Nanophotonics - Proceedings of SPIE Volume 8424 (2012)

The Solar Sail Materials (SSM) project – Status of activities

in Advances in Space Research (2011), 48(11), 1922-1926

Flat Fresnel doublets made of PMMA and PC: combining low cost production and very high concentration ratio for CPV

in Optics Express (2011), 19(S3), 280-294

The linear chromatic aberration (LCA) of several combinations of polycarbonates (PCs) and poly (methyl methacrylates) (PMMAs) as singlet, hybrid (refractive/diffractive) lenses and doublets operating with ... [more ▼]

The linear chromatic aberration (LCA) of several combinations of polycarbonates (PCs) and poly (methyl methacrylates) (PMMAs) as singlet, hybrid (refractive/diffractive) lenses and doublets operating with wavelengths between 380 and 1600 nm – corresponding to a typical zone of interest of concentrated photovoltaics (CPV) – are compared. Those comparisons show that the maximum theoretical concentration factor for singlets is limited to about 1000 × at normal incidence and that hybrid lenses and refractive doublets present a smaller LCA increasing the concentration factor up to 5000 × and 2 × 106 respectively. A new achromatization equation more useful than the Abbé equation is also presented. Finally we determined the ideal position of the focal point as a function of the LCA and the geometric concentration which maximizes the flux on the solar cell. [less ▲]

A spectral surface plasmon resonance sensor based on transmission grating: architecture analysis dedicated to spectral sensors

(2010, September)

Surface Plasmons Resonance (SPR) architectures based on grating coupler/disperser combination is an attractive alternative for spectral-based sensing. We present a new concept where the plasmon coupling ... [more ▼]

Surface Plasmons Resonance (SPR) architectures based on grating coupler/disperser combination is an attractive alternative for spectral-based sensing. We present a new concept where the plasmon coupling occurs through thin film grating and sensing occurs via the first diffraction order in reflective or transmitive mode. The developed geometry is dedicated to droplet sensing. The extension of the architecture to bi-dimensional array of sensors is also facilitated. This paper describes several designs of sensors. The analysis of their theoretical performances is demonstrated and compared, including a sensitivity evaluation. [less ▲]

Understanding of optical readout accuracy with micromechanical sensor cantilever monitored by surface plasmon resonanc

in Optics Communications (2009), 282

This paper reports a concept of micromechanical sensing of environmental condition using the surface plasmon resonance phenomenon. We calculate the resolution in the cantilever bending monitoring using ... [more ▼]

This paper reports a concept of micromechanical sensing of environmental condition using the surface plasmon resonance phenomenon. We calculate the resolution in the cantilever bending monitoring using the transfer matrix numerical method. We show that the cantilever deflection can be monitored with a resolution in the nanometer range. The SPs resonance behavior of the multilayer stack in the case of gold cantilever is discussed. We believe that this concept permits a low cost and ease of fabrication for a large bi-dimensional array of sensors with an enhanced signal-to-noise ratio. [less ▲]

A far infrared/terahertz micromechanical sensor based on surface plasmons resonance

in Proceedings of SPIE (2008), 7113

This paper describes a new concept related to the bolometric micromechanical sensors for detecting far IR and THz radiation. We believe that this concept permits a low cost and ease of fabrication of ... [more ▼]

This paper describes a new concept related to the bolometric micromechanical sensors for detecting far IR and THz radiation. We believe that this concept permits a low cost and ease of fabrication of large bi-dimensional array of sensors with an enhanced signal-to-noise ratio. The micromechanical sensor comprises a thermo-sensitive bi-material (multimaterial) micro-cantilever beam with a selective absorber dedicated to far IR and THz radiation energy, and optical readout system based on surface plasmon resonance for detecting the bending of the micro-cantilever element. To increase the radiation detector sensitivity, the SPR phenomenon is used for cantilever deflection monitoring. [less ▲]

Portable x-ray fluorescence spectrometer for coating thickness measurement

in Review of Scientific Instruments (2007), 78(12),

A handheld x-ray spectrometer has been realized and tested. The purpose of the device is to measure the thickness of coated samples in the range of 1-1500 nm in an industrial environment. Accuracy of ... [more ▼]

A handheld x-ray spectrometer has been realized and tested. The purpose of the device is to measure the thickness of coated samples in the range of 1-1500 nm in an industrial environment. Accuracy of similar to 3% has been achieved in this range with a measurement time of 1 min. Automated software has been implemented to allow utilization by a nonspecialist operator. An automated calibration procedure, based on measurements of reference samples, is used. (C) 2007 American Institute of Physics. [less ▲]