References of "Bertrand, Patrick"
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See detailModeling the dissociation and ionization of a sputtered organic molecule
Solomko, V.; Verstraete, Matthieu ULg; Delcorte, A. et al

in Applied Surface Science (2006), 252

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See detailAb-initio density functional study of defect-free and defective CdO
Ferro, R.; Rodriguez, J. A.; Verstraete, Matthieu ULg et al

in Physica Status Solidi C. Current Topics in Solid State Physics (2005), 2

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See detailElectrodeposition of mixed adherent thin films of poly(ethyl acrylate) and polyacrylonitrile onto nickel
Baute, Noëlle; Geskin, Victor M; Lazzaroni, Roberto et al

in e-Polymers (2004), (63), 1-20

Adherent thin polymer films have been prepared by sequential electrodeposition of ethyl acrylate (EA) and acrylonitrile (AN) onto nickel. Their composition has been studied by IR spectroscopy and time of ... [more ▼]

Adherent thin polymer films have been prepared by sequential electrodeposition of ethyl acrylate (EA) and acrylonitrile (AN) onto nickel. Their composition has been studied by IR spectroscopy and time of flight-secondary ion mass spectrometry. Morphology and thickness have been analyzed by atomic force microscopy and ellipsometry, respectively, and compared to single component films of PEA and PAN. No microphase separation was detected in the mixed PEA/PAN films. These show a granular morphology comparable to that of PAN films. The grains contain the two constitutive polymers, as confirmed by the selective thermal degradation of PEA. [less ▲]

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See detailChemical Recognition of Antioxidants and UV-light Stabilizers on the Surface of Polypropylene : Atomic Force Microscopy with Chemically Modified Tips
Duwez, Anne-Sophie ULg; Poleunis, Claude; Bertrand, Patrick et al

in Langmuir (2001), 17

We show in this paper that it is possible to locally detect additives on the surface of polypropylene with chemically modified atomic force microscopy (AFM) tips. Gold-coated AFM tips modified with methyl ... [more ▼]

We show in this paper that it is possible to locally detect additives on the surface of polypropylene with chemically modified atomic force microscopy (AFM) tips. Gold-coated AFM tips modified with methyl and hydroxyl terminated self-assembled alkanethiol monolayers were used to measure adhesion forces on a process-stabilizing agent (Irgafos 168), an antioxidant (Irganox 1010), and UV-light stabilizers (Tinuvin 770, Dastib 845, Chimassorb 944, and Hostavin N30). Pull-off force measurements carried out on these pure additive films have shown that it is possible to discriminate between antioxidants and UV-light stabilizers. We have evidenced a characteristic fingerprint for each additive, according to the functionality of the tip used and themediumwherein the force measurements are realized (water or nitrogen atmosphere). Similarly we have measured pull-off forces on a melt-pressed polypropylene sample stabilized with Irgafos 168, Irganox 1010, and Tinuvin 770. These adhesion force measurements show that the extreme surface of the polymer is mainly made of a layer of Tinuvin 770. These results have been compared to those obtained from time-of-flight secondary ion mass spectrometry measurements [less ▲]

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